A new experimental equipment called NANOPLAST was developed few years ago. It consists in three UHV chambers interconnected together and allows to investigate by scanning tunnelling microscopy the evolution at the atomic scale of crystalline surfaces submitted to compressive strains (or stresses). For details, see nanoplast.pprime.fr/en/. The strain/strain curve can be acquired simultaneously and the temperature can be tuned from approximately 50 to 650 K for in situ (i.e. scanning STM tip always in contact with the surface) investigations or up to 1200 K for ex situ observations. Two current fields of research pay our attention. (1) The first one is related to understand the elementary plastic mechanisms taking place in crystals. When plastically strained, interesting signatures appear at the free surface of crystals, called slip traces, those height is only about a few hundreds of picometers. The slip traces allow to investigate at the atomic scale the pathway of single dislocations (the structural defaults that are responsible of plasticity) gliding in their slip planes. These experimental results are of great interest to compare with what can be routinely obtained at the same scale by atomistic simulations such as molecular dynamics or functional density theory1,2. (2) The second one concerns the stress- induced evolution of surface atomic structures to reach some surface patterns that could be of great interest for specific functional properties in the future. It can be for instance how does the chevron-like Au(111) reconstruction evolve depending on the intensity and direction of stress in the elastic regime3,4 or how vicinal surfaces characterized by successive elementary atomic steps are destabilized by the gliding dislocations5,6. In this case, the dislocations are using as nano-engineering tools to put the surface out of equilibrium. 1Douat et al., Scripta Materialia 183 (2020) 81 2Bonneville et al., Modelling Simul. Mater. Sci. Eng. 32 (2024) 065021 3Chauraud et al., Surface Science 714 (2021) 121908. 4Chauraud et al., Phys. Rev. B 99 (2019) 195404. 5Coupeau et al., Phys. Review B 93 (2016) 041405. 6Coupeau et al., Acta Materialia 175 (2019) 206. |